Coating Thickness Analyzer VR-XAU is an advanced X-ray fluorescence (XRF) analyzer stands at the forefront of this field, offering unparalleled accuracy and reliability in measuring coating thickness. Whether you are ensuring the quality of a protective layer, optimizing production processes, or conducting critical research, the VR-XAU is your indispensable partner. The VR-XAU boasts advanced capabilities that cater to a wide range of applications across various industries, from aerospace to automotive, electronics to precious metals.

Advangtages:

• Up to down optical path
• Customized SI-PIN detector
• Non-destructive zoom detection technology, manual zoom function
• Advanced EFP algorithm and low-light focusing technology
• Advance spectrum decomposition, reduce the interference of adjacent element spectra, improve the test accuracy and detection limit.