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    GOLDLINK TECH (HK) CO.,LIMITED
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    Semiconductor chip test probe head (Pd Alloy,Reduced Crown)
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    Description
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    Description

    (1)Semiconductor chip test probe Top Plunger& Bottom Plunger

    Pd Alloy: Top plunger,Bottom plunger

    BeCu: Top plunger,Bottom plunger

    SK4: Top plunger,Bottom plunger

    (2)Manufacturing Technology

    Compound cutting with high precision CNC automatic lathe.

    Heat treatment.

    Manufacture of bars and coils of palladium alloys, etc.

    Surface finishing.

    (3)Special Processing Technology

    Ultra-micro machining capability:part OD>0.02mm.

    Micro compound cutting,front and rear end processing.

    Micro hole machining,hole ID>0.10mm.

    Mirror surface processing on probe head.

    Precision metal alloy drawing,straightening and cutting.


    HKTDC Exhibitor
    GOLDLINK TECH (HK) CO.,LIMITED

    GOLDLINK TECH (HK) CO.,LIMITED

    Hong Kong

    Chain Store, Exporter, Manufacturer

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