This device offers concurrent measurement of optical and electric properties by temperature change of high output and multi-chip LEDs, OLEDs and module LEDs. Current connection and measurement are possible for up to 3A and continuous and pulse types are available.

• Minimum pulse width: 200μsec.
• Sourcemeter extension up to 32 channels.
• Support with the adapter suitable various package types.
• High-speed and highly precise sourcemeter.
• Highly sensitive and high-resolution spectrometer.
• Concurrent adoption of barrel and integrating sphere.